TY - GEN
T1 - An optical diffuse reflectance model for the characterization of a si wafer with an evaporated SiO2 layer
AU - Zarzycki A.
AU - Galeano J.
AU - Bargiel S.
AU - Andrieux A.
AU - Gorecki C.
Y1 - 2019
UR - http://hdl.handle.net/20.500.12622/3173
AB -
ER -
@misc{20.500.12622_3173,
author = {Zarzycki A. and Galeano J. and Bargiel S. and Andrieux A. and Gorecki C.},
title = {An optical diffuse reflectance model for the characterization of a si wafer with an evaporated SiO2 layer},
year = {2019},
abstract = {},
url = {http://hdl.handle.net/20.500.12622/3173}
}RT Generic
T1 An optical diffuse reflectance model for the characterization of a si wafer with an evaporated SiO2 layer
A1 Zarzycki A.
A1 Galeano J.
A1 Bargiel S.
A1 Andrieux A.
A1 Gorecki C.
YR 2019
LK http://hdl.handle.net/20.500.12622/3173
AB
OL Spanish (121)
