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An optical diffuse reflectance model for the characterization of a si wafer with an evaporated SiO2 layer

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Date
2019
Author
Zarzycki A.
Galeano J.
Bargiel S.
Andrieux A.
Gorecki C.
Metadata
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Source
https://www.scopus.com/inward/record.uri?eid=2-s2.0-85062031528&doi=10.3390%2fs19040892&partnerID=40&md5=e6d9e2fde60b6f44c35d4915a112b123
URI
http://hdl.handle.net/20.500.12622/3173
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  • Artículos [930]

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