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dc.contributor.authorVallejo M.
dc.contributor.authorDe La Espriella C.
dc.contributor.authorGómez-Santamaría J.
dc.contributor.authorRamírez-Barrera A.F.
dc.contributor.authorDelgado-Trejos E.
dc.date.accessioned2020-08-28T22:27:38Z
dc.date.available2020-08-28T22:27:38Z
dc.date.issued2019
dc.identifier.urihttp://hdl.handle.net/20.500.12622/3180
dc.sourceScopus
dc.source.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-85078199786&doi=10.1088%2f1361-6501%2fab4b39&partnerID=40&md5=67e467aa1905ffa506c9b76a1e1fb6de
dc.titleSoft metrology based on machine learning: A info:eu-repo/semantics/reviewspa
dc.title.alternativeMeasurement Science and Technology
dc.typeinfo:eu-repo/semantics/review
dc.rights.accessrightsinfo:eu-repo/semantics/closedAccess
dc.relation.citationissue3spa
dc.identifier.doi10.1088/1361-6501/ab4b39
dc.relation.citationvolume31
dc.description.edition32001
dc.type.versioninfo:eu-repo/semantics/publishedVersion


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